Nicholas G. Paulter
PLENARY
Metrology for the Technologies Used in Security and Safety
Nicholas G. Paulter
Security Technologies Group at the National Institute of Standards and Technology
ABSTRACT
This presentation describes the metrology associated with specific technologies used in security and safety applications. The technologies will include different imaging modalities (x-ray, long-wave infrared, microwave/millimeter-wave, and rf), applications (checkpoint security, stand-off/through-barrier, firefighter), and activities (development of test methods, test artifacts, performance requirements, documentary standards).
SPEAKER BIOGRAPHY
Nick Paulter is the Leader of the Security Technologies Group at the National Institute of Standards and Technology (NIST) in Gaithersburg, MD.
In that capacity, he oversees metrology programs related to high-strength fiber characterization, concealed-weapon sensing and imaging, through-wall surveillance, characterization of materials and system used in impact mitigation, traffic control devices, and biometrics for identification. He received an NIST Bronze Medal in 2003 for his work in developing minimum performance requirements for metal detectors and a Department of Commerce Silver Medal in 2018 for research and development of new objective methods to assess image quality in security X-ray systems. Nick is an IEEE Fellow. He is currently the chair of the IEEE TC-10 Subcommittee on Pulse Techniques (SCOPT); chair of the ASTM F12.60 Subcommittee on Controlled Access Security, Search, and Screening Equipment; convener of the IEC TC85 Working Group 22 on the Waveform Parameter Measurements; and the Technical Advisor to the US National Committee to the IEC TC85.
